Anhui Keye Intelligent Technology Co., Ltd

Anhui Keye Intelligent Technology Co., Ltd

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Deep Learning vision based Automated Inspection System AI Capacitance Detection Machine

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Anhui Keye Intelligent Technology Co., Ltd
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City:hefei
Province/State:anhui
Country/Region:china
Contact Person:MrGary
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Deep Learning vision based Automated Inspection System AI Capacitance Detection Machine

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Place of Origin :China
Brand Name :KEYE
Certification :ISO/CE
MOQ :1 SET
Price :USD20000~USD50000
Packaging Details :Fumigation-Free Wood
Delivery Time :6 To 8 Weeks
Payment Terms :T/T Or F/C
Supply Ability :1 Set Per 4 Weeks
Model Number :KY-PC-C10D
Connectivity :Ethernet
Inspection Type :Visual
Image Processing Technology :Advanced
Product Type :Machine
User Interface :Intuitive
Data Management :Real-time
Software :Customizable
Inspection Speed :High
Accuracy :High
Lighting Type :LED
Camera Type :High-resolution
Resolution :High
Compatibility :Versatile
Function :Inspection
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We proudly introduce our groundbreaking 10-Camera AI Capacitance Detection Machine – a paradigm-shifting solution for high-precision electronic component inspection. Designed for SMT assembly lines, semiconductor packaging, and advanced capacitor manufacturing, this system integrates synchronized multi-angle vision with non-contact capacitance tomography to deliver unprecedented quality control.

Key technological advantages include:

  • Multi-perspective capacitance mapping: 10 high-speed cameras (120fps) coupled with RF sensors generate 3D dielectric profiles

  • Deep learning defect recognition: AI algorithms detect micro-defects (≥5µm) including electrode cracks, delamination, and electrolyte leakage

  • Real-time parameter validation: Measures capacitance (0.1pF–100µF ±0.5%), ESR, and leakage current concurrently

  • Material degradation analysis: Identifies early-stage dielectric breakdown through impedance phase monitoring

Operating at 1,200 units/minute, our machine achieves >99.99% detection accuracy for Class 1 ceramic capacitors and polymer aluminum capacitors. The hybrid inspection technology reduces false calls by 55% compared to traditional LCR testers while providing full traceability per AEC-Q200 and IEC 60384 standards.

Featuring self-calibrating probes and IIoT-ready interfaces (OPC UA, SECS/GEM), this solution seamlessly integrates into smart factories. Optional modules support wafer-level inspection and automotive-grade component validation.

We invite you to witness live demonstrations showcasing how this system eliminates latent failures in high-reliability applications. Technical white papers and validation reports are available upon request.

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Core Innovation Highlights:

  1. Dual-Technology Fusion

    • Optical inspection + capacitance tomography

    • 3D dielectric profiling

  2. Unmatched Precision

    • 5µm defect resolution

    • ±0.5% capacitance tolerance

    • 1,200 UPM throughput

  3. Industry Compliance

    • AEC-Q200 (automotive electronics)

    • IEC 60384 (capacitor standards)

  4. Smart Manufacturing Ready

    • IIoT connectivity (OPC UA/SECS/GEM)

    • Self-calibration technology

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