Anhui Keye Intelligent Technology Co., Ltd
Anhui Keye Intelligent Technology Co., Ltd
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IML Defect Detection System with AI Vision
Our AI-Driven IML Defect Detection System revolutionizes quality control for in-mold labeled products, combining deep learning with high-resolution imaging to achieve unparalleled accuracy in high-speed manufacturing environments.
Core Technology:
Multi-spectral imaging: 12MP polarized cameras (x6) with coaxial LED arrays (0-50,000 lux adjustable)
Defect-recognition AI: Convolutional Neural Networks trained on 3M+ IML defect samples
3D surface reconstruction: Structured-light projection (5µm depth resolution)
Critical Defects Detected:
Labeling Defects
Wrinkles ≥0.2mm²
Edge lifting >100µm
Registration offset ±0.15mm
Material Flaws
Air traps/bubbles ≥Ø150µm
Carbon streaks (IR imaging)
Ink delamination
Structural Issues
Sink marks (0.1mm depth sensitivity)
Flow lines in transparent areas
Performance Specifications:
Throughput: 15 cycles/minute (compatible with 2,000-ton+ presses)
Accuracy: 99.98% defect capture rate (validated per ASTM F2913)
False positive rate: <0.1% (industry-best)
Lighting: Self-adaptive to material finishes (glossy/matte/textured)
Industry 4.0 Integration:
Real-time SPC dashboards with OEE tracking
Automated NG part rejection (<5ms latency)
SECS/GEM and OPC UA connectivity
Blockchain-secured quality records
Compliant with IATF 16949 and FDA 21 CFR for automotive, food packaging, and consumer goods applications. The system features HMI with one-click recipe changeover and generates AI-powered root cause analysis reports.
Target Applications:
▶ Automotive trim ▶ Food containers ▶ Cosmetic packaging ▶ Home appliance panels
This future-proof solution reduces scrap rates by up to 40% while eliminating manual inspection costs, delivering ROI within 7 months.
